L. Ion, M. I. Rusu, G. Socol, I. N. Mihăilescu, C. Tăzlăoanu, S. Antohe, Electrical and optical properties of nanostructured ZnO thin films for optoelectronic applications, J. Optoelectron. Adv. Mater. , 10/1010 (2008) 2599 - 2602

Title: Electrical and optical properties of nanostructured ZnO thin films for optoelectronic applications

Abstract: Electrical and optical characterization of ZnO thin films produced by pulsed laser deposition (PLD) have been carried out. The films were deposited under various conditions and were optimized for use in hybrid organic/inorganic photovoltaic cells. XRD spectra revealed they had a polycrystalline structure of wurtzite type, preferentially oriented along the [001] axis situated in the growth direction. With increasing substrate temperature, the texture improves. The electrical properties of the films were studied over a large temperature range. Charge transport occurs through either a conduction band mechanism, at high temperatures, and hopping at temperatures below 60 K. The main defects controlling electrical properties of the films were investigated by the method of thermally stimulated currents.

Key words: Zinc oxide; PLD; XRD; TSC; Optical properties