I.C. Vasiliu, M. Gartner, M. Anastasescu, L. Todan, L. Predoana, M. Elisa, C. Negrila, F. Ungureanu, C. Logofatu, A. Moldovan, R. Birjega and M. Zaharescu, Structural and optical properties of the SiO2–P2O5 films obtained by sol–gel method , Thin Solid Films, 515/16 (2007) 6601-6605

Title: Structural and optical properties of the SiO2–P2O5 films obtained by sol–gel method

Abstract: A comparative study of the sol-gel films prepared in the SiO2-P2O5 system starting with triethylphosphate, triethylphosphite and phosphoric acid as P precursors was performed. The work addresses basic aspects of physics, chemistry, and engineering of oxide films for applications in microelectronics, sensing, nano-photonics, and optoelectronics by establishing the influence of different precursors on the composition, structure and optical properties of the obtained films. The influence of the type of substrate (glass and indium tin oxide coated glass) and of the thermal treatment (200 and 500 degrees C on their structure and properties was studied. By spectroscopic ellipsometry, X-Ray photoemission spectroscopy and atomic force microscopy measurements the high vaporization of the phosphorous during the densification of the films by thermal treatment was noticed when P-alkoxides were used. The phosphoric acid that forms chemical bond with silica network during the sol-gel process leads to better incorporation of P in the silica network as compared to the P-alkoxides.

Key words: phosphorus silicate films; sol-gel; ellipsometry; XPS; AFM