N. Mincu, Improvements of the Z-scan method used in the study of optical nonlinearities, Journal of Optoelectronics and Advanced Materials, 1/2 (1999) 25-33

Title: Improvements of the Z-scan method used in the study of optical nonlinearities

Abstract: Z-scan method used for the study of optical nonlinearities in materials has been improved on the basis of a complex analysis of the laser beam. Using a CCD camera for beam intensity distribution measurement and a soft aperture, there was demonstrated the possibility to rise significantly the sensitivity, of the method and the signal to noise ratio of the Z-scan curves. An improved two-dimensional measurement procedure for induced lens is proposed. The etalon effect and the influence of the high nonlinear absorption on the transmission of silicon samples were investigated in the case of laser pulses of microsecond and nanosecond length.

Keywords: Z-scan; optical nonlinearity

Author: N. Mincu